&lt;title&gt;Pulsed laser deposition of quantum-sized bismuth films&lt;/title&gt;

G. Y. Shubnii; Alexander N. Zherikhin; E. V. Prokopov; A. M. Tskhovrebov; L. N. Zherikhina; В. В. Воронов

doi:10.1117/12.337530

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<title>Pulsed laser deposition of quantum-sized bismuth films</title>

G. Y. Shubnii Alexander N. Zherikhin E. V. Prokopov A. M. Tskhovrebov L. N. Zherikhina В. В. Воронов

Year: 1999 Journal: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 3688 Pages: 330-334 Publisher: SPIE

DOI: 10.1117/12.337530

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Abstract

Thin bismuth films were deposited by pulsed laser deposition technique. The conductivity of films was measured in-situ during deposition process. Quantum oscillations of conductivity were observed. Films were investigated by photoelectron spectroscopy technique. Red shift of outer work function for about 1.5 eV for thin films was observed.

Keywords:

Pulsed laser deposition Bismuth Thin film X-ray photoelectron spectroscopy Conductivity Deposition (geology) Materials science Analytical Chemistry (journal) Work function Laser Optoelectronics Chemistry Optics Nanotechnology Nuclear magnetic resonance Metal Physics Metallurgy Physical chemistry

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nanoparticles nucleation surface interactions

Physical Sciences → Earth and Planetary Sciences → Atmospheric Science

Surface and Thin Film Phenomena

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Advanced Materials Characterization Techniques

Physical Sciences → Engineering → Biomedical Engineering

<title>Pulsed laser deposition of quantum-sized bismuth films</title>

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