Dielectric measurements by H‐plane dielectric loaded cavity with three layers

Abstract

Abstract This paper describes a method for measuring the complex dielectric constant of a dielectric, by using a resonance of a rectangular cavity (section 3.48 × 1.58 cm 2 , length 8.30 cm) filled with three layers. The top layer is air; the second layer is a low‐loss dielectric whose dielectric constant is known; and the third layer is the dielectric under measurement. Four plastic screws are used for pressing the dielectrics. It has been confirmed that this method works efficiently, although a specimen under measurement must have a uniform thickness and must be flattened by pressing. The measurements were carried out in a 7‐GHz band.