JOURNAL ARTICLE

Intrinsic Electrical Conductivity in Silicon Carbide

Joshua Racette

Year: 1957 Journal:   Physical Review Vol: 107 (6)Pages: 1542-1544   Publisher: American Institute of Physics

Abstract

Intrinsic electrical conductivity in $n$-type hexagonal silicon carbide single crystals has been measured. The method of measurement is discussed. The value for the band gap extrapolated to absolute zero, assuming intrinsic conductivity of the form $\ensuremath{\sigma}=\mathrm{constant}\ifmmode\times\else\texttimes\fi{}{e}^{\ensuremath{-}\frac{\ensuremath{\Delta}E}{2kT}}$, has been found to be $\ensuremath{\Delta}E(0)=3.1\ifmmode\pm\else\textpm\fi{}0.2$ ev. The conductivity intercept at $T=\ensuremath{\infty}$ is (1.3\ifmmode\pm\else\textpm\fi{}0.7)\ifmmode\times\else\texttimes\fi{}${10}^{4}$ (ohm-${\mathrm{c}\mathrm{m})}^{\ensuremath{-}1}$.

Keywords:
Electrical resistivity and conductivity Physics Condensed matter physics Silicon carbide Ohm Conductivity Hexagonal crystal system Zero (linguistics) Materials science Crystallography Quantum mechanics

Metrics

14
Cited By
1.15
FWCI (Field Weighted Citation Impact)
3
Refs
0.83
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Silicon Carbide Semiconductor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Semiconductor Devices and Circuit Design
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Semiconductor materials and devices
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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