JOURNAL ARTICLE

Electronic Structure and Electrical Conductivity of Amorphous Ni–Si Alloy Films

Atsuo IsobeM. YamadaKazuhide Tanaka

Year: 1997 Journal:   Journal of the Physical Society of Japan Vol: 66 (7)Pages: 2103-2109   Publisher: Physical Society of Japan

Abstract

The Ni x Si 100- x system forms a homogeneous amorphous phase over wide ranges of composition (0≦ x ≦34 and 63≦ x ≦73) when the alloy is deposited on a substrate by sputtering at ambient temperature. The electrical conductivity of the amorphous alloy changes characteristically with Ni concentration from a semiconductor-like temperature dependence to a metallic one, the transition taking place between 10.4 and 16.6% Ni. UPS valence band spectra show that the density of states at the Fermi level is minimal below about 7% Ni, but emerges abruptly above this concentration. The relationship between the electrical transport properties and the electronic structure of the amorphous alloys is discussed in three characteristic regions of the Ni concentration.

Keywords:
Materials science Amorphous solid Electrical resistivity and conductivity Alloy Fermi level Density of states Condensed matter physics Sputtering Amorphous metal Valence (chemistry) Semiconductor Conductivity Analytical Chemistry (journal) Thin film Metallurgy Crystallography Nanotechnology Optoelectronics Physical chemistry Electron Chemistry

Metrics

8
Cited By
5.78
FWCI (Field Weighted Citation Impact)
25
Refs
0.96
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Metallic Glasses and Amorphous Alloys
Physical Sciences →  Engineering →  Mechanical Engineering
Semiconductor materials and interfaces
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Thin-Film Transistor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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