JOURNAL ARTICLE

Direct observation of SiH3 on a 1%-HF-treated Si(111) surface by scanning tunneling microscopy

Yukinori MoritaKazushi MikiHiroshi Tokumoto

Year: 1991 Journal:   Applied Physics Letters Vol: 59 (11)Pages: 1347-1349   Publisher: American Institute of Physics

Abstract

Scanning tunneling microscopy (STM) has been made on an as-prepared Si(111) surface by the 1%-HF treatment. The STM images for both the empty and filled states exhibit regular dots with the threefold symmetry on the flat parts of the surface: the distance between dots measures 2.2 Å. The origin of these dots can be ascribed to the H atoms of the trihydride (SiH3) phase on the Si(111) surface. The electrons can tunnel from or to the tail states of the σ (filled) states or the σ* (empty) states around the H atoms for the SiH3 radicals, respectively.

Keywords:
Scanning tunneling microscope Quantum tunnelling Scanning electron microscope Scanning tunneling spectroscopy Silicon Surface states Electron Condensed matter physics Materials science Symmetry (geometry) Surface (topology) Microscopy Nanotechnology Chemistry Physics Optics Optoelectronics Geometry Quantum mechanics

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20
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0.98
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Citation History

Topics

Advanced Chemical Physics Studies
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Surface and Thin Film Phenomena
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Graphene research and applications
Physical Sciences →  Materials Science →  Materials Chemistry

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