JOURNAL ARTICLE
Scanning tunneling microscopy of 1%-HF-treated Si(111) surfaces
Yukinori MoritaKazushi MikiHiroshi Tokumoto
Year: 1992 Journal: Ultramicroscopy Vol: 42-44 Pages: 922-927 Publisher: Elsevier BV
Keywords:
Scanning tunneling microscope Symmetry (geometry) Quantum tunnelling Chemistry Condensed matter physics Molecular physics Crystallography Materials science Nanotechnology Physics Geometry
Metrics
10
Cited By
1.07
FWCI (Field Weighted Citation Impact)
10
Refs
0.73
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Semiconductor materials and interfaces
Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
Silicon Nanostructures and Photoluminescence
Physical Sciences → Materials Science → Materials Chemistry
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