JOURNAL ARTICLE

<title>Optical truss and retroreflector modeling for picometer laser metrology</title>

Braden E. Hines

Year: 1993 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 1947 Pages: 198-208   Publisher: SPIE

Abstract

Space-based astrometric interferometer concepts typically have a requirement for the measurement of the internal dimensions of the instrument to accuracies in the picometer range. While this level of resolution has already been achieved for certain special types of laser gauges, techniques for picometer-level accuracy need to be developed to enable all the various kinds of laser gauges needed for space-based interferometers. Systematic errors due to retroreflector imperfections become important as soon as the retroreflector is allowed to either translate in position or articulate in angle away from its nominal zero-point. Also, when combining several laser interferometers to form a three-dimensional laser gauge (a laser optical truss), systematic errors due to imperfect knowledge of the truss geometry are important as the retroreflector translates away from its nominal zero-point. In order to assess the astrometric performance of a proposed instrument, it is necessary to determine how the effects of an imperfect laser metrology system impact the astrometric accuracy. This paper show the development of an error propagation model from errors in the 1-D metrology measurements through the impact on the overall astrometric accuracy for OSI. Simulations are then presented based on this development which were used to define a multiplier which determines the 1-D metrology accuracy required to produce a given amount of fringe position error.

Keywords:
Retroreflector Metrology Astronomical interferometer Optics Laser Dimensional metrology Physics Interferometry Truss Laser tracker Computer science Engineering

Metrics

9
Cited By
0.90
FWCI (Field Weighted Citation Impact)
0
Refs
0.72
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Advanced Measurement and Metrology Techniques
Physical Sciences →  Engineering →  Mechanical Engineering
Calibration and Measurement Techniques
Physical Sciences →  Engineering →  Aerospace Engineering
Adaptive optics and wavefront sensing
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

Related Documents

JOURNAL ARTICLE

<title>Multichannel averaging phasemeter for picometer precision laser metrology</title>

Peter G. HalversonDonald R. JohnsonA. KuhnertStuart ShaklanRobert Spero

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1999 Vol: 3740 Pages: 646-649
JOURNAL ARTICLE

<title>Laser Metrology</title>

David L. Wright

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1969 Vol: 0020 Pages: 99-106
JOURNAL ARTICLE

<title>Use of laser metrology optical truss for monitoring baseline motion</title>

Braden E. HinesMichael ShaoM. M. ColavitaD. H. Staelin

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1990 Vol: 1237 Pages: 87-100
JOURNAL ARTICLE

<title>Laser Speckle Metrology</title>

J.M. Burch

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1971 Vol: 0025 Pages: 149-156
JOURNAL ARTICLE

<title>Laser Metrology In Biomechanics</title>

Ryszard J. Pryputniewicz

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1983 Vol: 0370 Pages: 106-106
© 2026 ScienceGate Book Chapters — All rights reserved.