JOURNAL ARTICLE

<title>Multichannel averaging phasemeter for picometer precision laser metrology</title>

Peter G. HalversonDonald R. JohnsonA. KuhnertStuart ShaklanRobert Spero

Year: 1999 Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 3740 Pages: 646-649   Publisher: SPIE

Abstract

The Micro-Arcsecond Metrology (MAM) team at the Jet Propulsion Laboratory has developed a precision phasemeter for the Space Interferometry Mission (SIM). The current version of the phasemeter is well-suited for picometer accuracy distance measurements and tracks at speeds up to 50 cm/sec, when coupled to SIM's 1.3 micron wavelength heterodyne laser metrology gauges. Since the phasemeter is implemented with industry standard FPGA chips, other accuracy/speed trade-off points can be programmed for applications such as metrology for earth-based long-baseline astronomical interferometry (planet finding), and industrial applications such as translation stage and machine tool positioning. The phasemeter is a standard VME module, supports 6 metrology gauges, a 128 MHz clock, has programmable hardware averaging, and maximum range of 232 cycles (2000 meters at 1.3 microns).

Keywords:
Metrology Interferometry Jet propulsion Optics Physics Laser Dimensional metrology VMEbus Accuracy and precision Astronomical interferometer Remote sensing Electrical engineering Engineering Geology

Metrics

15
Cited By
0.63
FWCI (Field Weighted Citation Impact)
7
Refs
0.65
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Adaptive optics and wavefront sensing
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics
Advanced Measurement and Metrology Techniques
Physical Sciences →  Engineering →  Mechanical Engineering
Calibration and Measurement Techniques
Physical Sciences →  Engineering →  Aerospace Engineering

Related Documents

JOURNAL ARTICLE

<title>Precision laser element metrology</title>

Valentina AzarovaN. A. EfremovaVaytcheslav N. SvirinV. A. Sharov

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1998 Vol: 3407 Pages: 544-551
JOURNAL ARTICLE

<title>Laser Metrology</title>

David L. Wright

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1969 Vol: 0020 Pages: 99-106
JOURNAL ARTICLE

<title>Optical truss and retroreflector modeling for picometer laser metrology</title>

Braden E. Hines

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1993 Vol: 1947 Pages: 198-208
JOURNAL ARTICLE

<title>Laser Speckle Metrology</title>

J.M. Burch

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1971 Vol: 0025 Pages: 149-156
JOURNAL ARTICLE

<title>Laser Metrology In Biomechanics</title>

Ryszard J. Pryputniewicz

Journal:   Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Year: 1983 Vol: 0370 Pages: 106-106
© 2026 ScienceGate Book Chapters — All rights reserved.