JOURNAL ARTICLE
<title>Pattern Recognition For Automatic Visual Inspection</title>
Year: 1982 Journal: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE Vol: 0336 Pages: 12-19 Publisher: SPIE
Abstract
Three major approaches to pattern recognition, (1) template matching, (2) decision-theoretic approach, and (3) structural and syntactic approach, are briefly introduced. The application of these approaches to automatic visual inspection of manufactured products are then reviewed. A more general method for automatic visual inspection of IC chips is then proposed. Several practical examples are included for illustration.
Keywords:
Computer science Visual inspection Artificial intelligence Automated X-ray inspection Matching (statistics) Computer vision Pattern matching Template matching Pattern recognition (psychology) Engineering drawing Image processing Image (mathematics) Engineering
Metrics
5
Cited By
1.59
FWCI (Field Weighted Citation Impact)
0
Refs
0.82
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Industrial Vision Systems and Defect Detection
Physical Sciences → Engineering → Industrial and Manufacturing Engineering
Image and Object Detection Techniques
Physical Sciences → Computer Science → Computer Vision and Pattern Recognition
Advancements in Photolithography Techniques
Physical Sciences → Engineering → Electrical and Electronic Engineering
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