Characterization of epitaxial lanthanum lutetium oxide thin films prepared by pulsed-laser deposition

J. Schubert; O. Trithaveesak; W. Zander; M. Roeckerath; T. Heeg; H.Y. Chen; Chun‐Lin Jia; P. Meuffels; Yufei Jia; Darrell G. Schlom

doi:10.1007/s00339-007-4327-8

JOURNAL ARTICLE

Characterization of epitaxial lanthanum lutetium oxide thin films prepared by pulsed-laser deposition

J. Schubert O. Trithaveesak W. Zander M. Roeckerath T. Heeg H.Y. Chen Chun‐Lin Jia P. Meuffels Yufei Jia Darrell G. Schlom

Year: 2007 Journal: Applied Physics A Vol: 90 (3)Pages: 577-579 Publisher: Springer Science+Business Media

DOI: 10.1007/s00339-007-4327-8

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Keywords:

Pulsed laser deposition Lutetium Epitaxy Materials science Rutherford backscattering spectrometry Thin film Transmission electron microscopy Lanthanum Analytical Chemistry (journal) Dielectric Oxide Characterization (materials science) Optoelectronics Yttrium Nanotechnology Chemistry Inorganic chemistry

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Electronic and Structural Properties of Oxides

Physical Sciences → Materials Science → Materials Chemistry

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Ferroelectric and Piezoelectric Materials

Physical Sciences → Materials Science → Materials Chemistry

Characterization of epitaxial lanthanum lutetium oxide thin films prepared by pulsed-laser deposition

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