Fe–Nd–Ti Films with Perpendicular Magnetic Anisotropy

Kazuhiko Tsutsumi; Hiroshi Sugahara

doi:10.1143/jjap.23.l169

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Fe–Nd–Ti Films with Perpendicular Magnetic Anisotropy

Kazuhiko Tsutsumi Hiroshi Sugahara

Year: 1984 Journal: Japanese Journal of Applied Physics Vol: 23 (3A)Pages: L169-L169 Publisher: Institute of Physics

DOI: 10.1143/jjap.23.l169

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Abstract

Fe–Nd–Ti thin films with perpendicular magnetic anisotropy have been prepared by rf sputtering. Though Fe–Nd films has its easy axis of magnetization in the film plane, the addition of Ti to Fe–Nd causes the film to have an easy axis of magnetization in the normal to the film plane. The structure of Fe–Nd-Ti film is detected to be partially crystallized in amorphous alloy matrix.

Keywords:

Materials science Magnetization Film plane Magnetic anisotropy Perpendicular Amorphous solid Sputtering Anisotropy Condensed matter physics Alloy Thin film Nuclear magnetic resonance Composite material Optics Crystallography Magnetic field Chemistry Nanotechnology Physics

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Magnetic properties of thin films

Physical Sciences → Physics and Astronomy → Atomic and Molecular Physics, and Optics

Magnetic Properties and Applications

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Metallic Glasses and Amorphous Alloys

Physical Sciences → Engineering → Mechanical Engineering

Fe–Nd–Ti Films with Perpendicular Magnetic Anisotropy

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