Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance

Helene E. de Bruijn; Bert S. F. Altenburg; R.P.H. Kooyman; Jan Greve

doi:10.1016/0030-4018(91)90353-f

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Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance

Helene E. de Bruijn Bert S. F. Altenburg R.P.H. Kooyman Jan Greve

Year: 1991 Journal: Optics Communications Vol: 82 (5-6)Pages: 425-432 Publisher: Elsevier BV

DOI: 10.1016/0030-4018(91)90353-f

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Keywords:

Materials science Dielectric Optics Surface plasmon resonance Surface plasmon Resonance (particle physics) Surface plasmon polariton Plasmon Optoelectronics Nanoparticle Nanotechnology Physics

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Surfactants and Colloidal Systems

Physical Sciences → Chemistry → Organic Chemistry

Proteins in Food Systems

Life Sciences → Agricultural and Biological Sciences → Food Science

Fluid Dynamics and Thin Films

Physical Sciences → Engineering → Computational Mechanics

Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance

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