Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopy

Kevin A. Peterlinz; R. Georgiadis

doi:10.1016/0030-4018(96)00238-6

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Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopy

Kevin A. Peterlinz R. Georgiadis

Year: 1996 Journal: Optics Communications Vol: 130 (4-6)Pages: 260-266 Publisher: Elsevier BV

DOI: 10.1016/0030-4018(96)00238-6

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Keywords:

Surface plasmon resonance Materials science Spectroscopy Dielectric Thin film Surface plasmon Resonance (particle physics) Optics Localized surface plasmon Monolayer Plasmon Surface plasmon polariton Optoelectronics Analytical Chemistry (journal) Chemistry Nanotechnology Physics Nanoparticle Atomic physics

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Topics

Gold and Silver Nanoparticles Synthesis and Applications

Physical Sciences → Materials Science → Electronic, Optical and Magnetic Materials

Plasmonic and Surface Plasmon Research

Physical Sciences → Engineering → Biomedical Engineering

Molecular Junctions and Nanostructures

Physical Sciences → Engineering → Electrical and Electronic Engineering

Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopy

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