JOURNAL ARTICLE

Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopy

Kevin A. PeterlinzR. Georgiadis

Year: 1996 Journal:   Optics Communications Vol: 130 (4-6)Pages: 260-266   Publisher: Elsevier BV
Keywords:
Surface plasmon resonance Materials science Spectroscopy Dielectric Thin film Surface plasmon Resonance (particle physics) Optics Localized surface plasmon Monolayer Plasmon Surface plasmon polariton Optoelectronics Analytical Chemistry (journal) Chemistry Nanotechnology Physics Nanoparticle Atomic physics

Metrics

139
Cited By
3.45
FWCI (Field Weighted Citation Impact)
20
Refs
0.94
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

Gold and Silver Nanoparticles Synthesis and Applications
Physical Sciences →  Materials Science →  Electronic, Optical and Magnetic Materials
Plasmonic and Surface Plasmon Research
Physical Sciences →  Engineering →  Biomedical Engineering
Molecular Junctions and Nanostructures
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
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