JOURNAL ARTICLE
USE OF HOLOGRAPHIC INTERFEROMETRY AND ELECTRONIC SPECKLE PATTERN INTERFEROMETRY FOR MEASUREMENTS OF DYNAMIC DISPLACEMENTS
M. CaponeroP. PasquaAntonio PaolozziI. Peroni
Year: 2000 Journal: Mechanical Systems and Signal Processing Vol: 14 (1)Pages: 49-62 Publisher: Elsevier BV
Keywords:
Electronic speckle pattern interferometry Holographic interferometry Speckle pattern Interferometry Holography Optics Speckle imaging Shearography Speckle noise Physics
Metrics
15
Cited By
1.13
FWCI (Field Weighted Citation Impact)
16
Refs
0.79
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Optical measurement and interference techniques
Physical Sciences → Computer Science → Computer Vision and Pattern Recognition
Advanced Measurement and Metrology Techniques
Physical Sciences → Engineering → Mechanical Engineering
Surface Roughness and Optical Measurements
Physical Sciences → Engineering → Computational Mechanics
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