Ferroelectric Thin Film Microwave Examination

Victor Kazmirenko; Yuriy Poplavko; L.P. Pereverzeva; Yuriy Prokopenko; Beomjin Kim; Minki Jeong; Sunggi Baik

doi:10.1080/00150190390206554

ScienceGate Book Chapters

JOURNAL ARTICLE

Ferroelectric Thin Film Microwave Examination

Victor Kazmirenko Yuriy Poplavko L.P. Pereverzeva Yuriy Prokopenko Beomjin Kim Minki Jeong Sunggi Baik

Year: 2003 Journal: Ferroelectrics Vol: 286 (1)Pages: 353-356 Publisher: Taylor & Francis

DOI: 10.1080/00150190390206554

Get Full-Text PDF Get Analytical Report

Abstract

A method for measuring of microwave properties at ferroelectric thin films has been developed. Studied films are deposited onto dielectric substrates, and film-on-substrate "sandwich" is arranged along waveguide. S 11 ( f ) or S 21 ( f ) dependences are studied depending on sensitivity. Redundant measured data processed with specially developed software. Keywords: FerroelectricThin FilmPermittivityLoss TangentRectangular Waveguide

Keywords:

Materials science Microwave Ferroelectricity Thin film Substrate (aquarium) Waveguide Dielectric Optoelectronics Nanotechnology Telecommunications Computer science

Metrics

Cited By

0.63

FWCI (Field Weighted Citation Impact)

Refs

0.70

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Microwave and Dielectric Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Ferroelectric Thin Film Microwave Examination

Abstract

Metrics

Citation History

Topics

Related Documents

Ferroelectric thin film microwave examination

Thin-film ferroelectric microwave devices

Microwave examination of ferroelectric film quality

Microwave characterization of ferroelectric thin-film materials

Microwave Tunable Device based on Thin Ferroelectric Film