JOURNAL ARTICLE
Dispersive Fourier Transform Spectroscopy Of Free-Standing Porous Silicon Films
Jarno SalonenK. SaarinenJ. PeuraJ. VilnikanojaI. K. SalomaaE LaineJ. Kauppinen
Year: 1997 Journal: MRS Proceedings Vol: 486 Publisher: Cambridge University Press
Keywords:
Materials science Refractive index Attenuation coefficient Porous silicon Absorption (acoustics) Fourier transform spectroscopy Spectroscopy Fourier transform infrared spectroscopy Absorption spectroscopy Optics Analytical Chemistry (journal) Silicon Spectral line Optoelectronics Composite material Chemistry Physics
Metrics
4
Cited By
0.90
FWCI (Field Weighted Citation Impact)
8
Refs
0.71
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Topics
Silicon Nanostructures and Photoluminescence
Physical Sciences → Materials Science → Materials Chemistry
Nanowire Synthesis and Applications
Physical Sciences → Engineering → Biomedical Engineering
Thin-Film Transistor Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
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