JOURNAL ARTICLE

Bare-board e-beam testing: The charge storage problem

Matthias BrünnerN. KolbenschlagG. WestermanB. Lischke

Year: 1988 Journal:   Microelectronic Engineering Vol: 8 (1-2)Pages: 25-35   Publisher: Elsevier BV
Keywords:
Leakage (economics) Miniaturization Printed circuit board Bistability Electronic circuit Materials science Beam (structure) Cathode Electrical engineering Cathode ray Optoelectronics Computer science Nanotechnology Electron Optics Engineering Physics

Metrics

2
Cited By
0.89
FWCI (Field Weighted Citation Impact)
7
Refs
0.74
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Advancements in Photolithography Techniques
Physical Sciences →  Engineering →  Electrical and Electronic Engineering
Electron and X-Ray Spectroscopy Techniques
Physical Sciences →  Materials Science →  Surfaces, Coatings and Films

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