Subthreshold characteristics of submicrometer polysilicon thin film transistor

D.N. Yaung; Y.K. Fang; Kun Huang; Y.J. Wang; Chin‐Chun Hung; Mong Liang; S.G. Wuu

doi:10.1016/s0040-6090(00)01766-1

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Subthreshold characteristics of submicrometer polysilicon thin film transistor

D.N. Yaung Y.K. Fang Kun Huang Y.J. Wang Chin‐Chun Hung Mong Liang S.G. Wuu

Year: 2001 Journal: Thin Solid Films Vol: 382 (1-2)Pages: 271-274 Publisher: Elsevier BV

DOI: 10.1016/s0040-6090(00)01766-1

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Keywords:

Thin-film transistor Materials science Subthreshold conduction Subthreshold swing Optoelectronics Threshold voltage Transistor Voltage Polysilicon depletion effect Subthreshold slope Impact ionization Ionization Electrical engineering Nanotechnology Chemistry Ion Gate oxide

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Thin-Film Transistor Technologies

Physical Sciences → Engineering → Electrical and Electronic Engineering

Advancements in Semiconductor Devices and Circuit Design

Physical Sciences → Engineering → Electrical and Electronic Engineering

Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Subthreshold characteristics of submicrometer polysilicon thin film transistor

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