Preparation and waveguide properties of Bi_3.15Nd_0.85Ti₃O₁₂thin films

Abstract

A Bi3.15Nd0.85Ti3O12 (BNT0.85) thin film was prepared on quartz substrates by metal-organic solution deposition. The BNT0.85 thin film annealed at 700 °C in a rapid thermal annealing system with flowing oxygen is polycrystalline and in single phase. The optical transmission of the film was measured by a Hitachi U-3410 spectrophotometer, and the dispersion of the refractive index of the BNT0.85 thin film was calculated by the Manifacier method. A Metricon 2010 prism coupler was used to investigate the excited transverse electrical and transverse magnetic modes in the BNT0.85 thin film. The band gap of the BNT0.85 thin film is 3.82 eV. The refractive index and the thickness of the BNT0.85 thin film at 632.8 nm were 2.3374 and 568.3 nm, respectively, which are in good agreement with the transmission measurements.