JOURNAL ARTICLE
Structural, electrical and thermoelectrical properties of (BiSb)Te thin films grown by MOCVD process
B. AboulfarahAlain GianiAlexandre BoyerA. Mzerd
Year: 2000 Journal: Annales de Chimie Science des Matériaux Vol: 25 (4)Pages: 263-267 Publisher: International Information and Engineering Technology Association
Keywords:
Metalorganic vapour phase epitaxy Seebeck coefficient Materials science Scanning electron microscope Chemical vapor deposition Thin film Electrical resistivity and conductivity Substrate (aquarium) Analytical Chemistry (journal) Mineralogy Chemistry Optoelectronics Nanotechnology Composite material Physics Epitaxy Thermal conductivity Layer (electronics)
Metrics
10
Cited By
0.00
FWCI (Field Weighted Citation Impact)
12
Refs
0.05
Citation Normalized Percentile
Is in top 1%
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Citation History
Topics
Advanced Thermoelectric Materials and Devices
Physical Sciences → Materials Science → Materials Chemistry
Advanced Thermodynamics and Statistical Mechanics
Physical Sciences → Physics and Astronomy → Statistical and Nonlinear Physics
Thermal Radiation and Cooling Technologies
Physical Sciences → Engineering → Civil and Structural Engineering
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