Electrodeposited Biaxially Textured CeO2 and CeO2:Sm Buffer Layer for YBCO Superconductor Oxide Films

Abstract

Nonvacuum electrodeposition was used to prepare biaxially textured CeO2 and Sm‐doped CeO2 coatings on Ni‐W substrates. The samples were characterized by X‐ray diffraction (including θ/2θ, pole figures, omega scans, and phi scans), atomic force microscopy (AFM), Auger electron spectroscopy (AES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Full‐width at half‐maximum values of the ω scan and φ scan of the electrodeposited layers were better than those of the Ni‐W base substrates, indicating improved biaxial texturing of the electrodeposited layers.