JOURNAL ARTICLE

Magnetic Properties of Rutile Ti1-xFexO2 Epitaxial Thin Films

Abstract

Growth conditions for pulsed laser deposition of ferromagnetic Ti1-xFexO2 films with the rutile structure have been optimized on the basis of magnetooptical Kerr effect (MOKE) measurements. Thus, it was found that Ti0.94Fe0.06O2 films prepared under very limited growth conditions, at a substrate temperature of 650–675°C and an oxygen pressure of ∼1 ×10-6 Torr, show ferromagnetism at room temperature. The optimized films revealed a saturation magnetization of 1.3 µB and a coercive field of 0.14 kOe. From XPS measurements, the valence state of Fe was determined to be 3+, ruling out the possibility that ferromagnetism may arise from Fe3O4 nanoparticles.

Keywords:
Materials science Coercivity Ferromagnetism X-ray photoelectron spectroscopy Pulsed laser deposition Rutile Magnetization Thin film Valence (chemistry) Condensed matter physics Torr Analytical Chemistry (journal) Epitaxy Kerr effect Substrate (aquarium) Nuclear magnetic resonance Magnetic field Nanotechnology Chemistry

Metrics

13
Cited By
1.67
FWCI (Field Weighted Citation Impact)
12
Refs
0.81
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Citation History

Topics

ZnO doping and properties
Physical Sciences →  Materials Science →  Materials Chemistry
Electronic and Structural Properties of Oxides
Physical Sciences →  Materials Science →  Materials Chemistry
Copper-based nanomaterials and applications
Physical Sciences →  Materials Science →  Materials Chemistry

Related Documents

JOURNAL ARTICLE

Rutile Ti1-xCoxO2-δ p-type Diluted Magnetic Semiconductor Thin Films

Nak‐Jin SeongSoon‐Gil YoonYoung-Hoon ChoMyung‐Hwa Jung

Journal:   Transactions on Electrical and Electronic Materials Year: 2006 Vol: 7 (3)Pages: 149-153
JOURNAL ARTICLE

Magnetic Properties of (Cr1-xFex)O2

Eiichi HirotaToshihiro MiharaTadashi KawamataM. Asanuma

Journal:   Japanese Journal of Applied Physics Year: 1970 Vol: 9 (6)Pages: 647-647
JOURNAL ARTICLE

Growth study of epitaxial FexZn1−xF2 thin films

J. L. McChesneyMichael HetzerHao ShiTimothy CharltonDavid Lederman

Journal:   Journal of materials research/Pratt's guide to venture capital sources Year: 2001 Vol: 16 (6)Pages: 1769-1775
© 2026 ScienceGate Book Chapters — All rights reserved.