JOURNAL ARTICLE
Temperature dependence of resistance in reactively sputtered RuO2 thin films
Raymond Kai‐Yu TongV. JelenkovicW.Y. CheungS. P. Wong
Year: 2001 Journal: Journal of Materials Science Letters Vol: 20 (8)Pages: 699-700 Publisher: Springer Science+Business Media
Keywords:
Materials science
Metrics
23
Cited By
1.10
FWCI (Field Weighted Citation Impact)
9
Refs
0.79
Citation Normalized Percentile
Is in top 1%
Is in top 10%
Citation History
Topics
Electrical and Thermal Properties of Materials
Physical Sciences → Engineering → Electrical and Electronic Engineering
Thin-Film Transistor Technologies
Physical Sciences → Engineering → Electrical and Electronic Engineering
Semiconductor materials and devices
Physical Sciences → Engineering → Electrical and Electronic Engineering
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