JOURNAL ARTICLE

Mechanical properties of polycrystalline 3C-SiC thin films with various doping concentrations

Kang-San KimGwiy‐Sang Chung

Year: 2008 Journal:   Journal of Sensor Science and Technology Vol: 17 (4)Pages: 256-260   Publisher: Korean Sensors Society

Abstract

This paper describes the mechanical properties of poly(polycrystalline) 3C-SiC thin films with various doping concentration, in which poly 3C-SiC thin fil's mechanical properties according to the n-doping concentration 1($9.2{\times}10^{15}cm^{-3}$), 3($5.2{\times}10^{17}cm^{-3}$), and 5%($6.8{\times}10^{17}cm^{-3}$) respectively were measured by nano indentation. In the case of $9.2{\times}10^{15}cm^{-3}n$-doping concentration, Young's modulus and hardness were obtained as 270 and 30 GPa, respectively. When the surface roughness according to n-doping concentrations was investigated by AFM(atomic force microscope), the roughness of poly 3C-SiC thin films doped by 5% concentration was 15 nm, which is also the best of them.

Keywords:
Doping Materials science Crystallite Thin film Atomic force microscopy Surface roughness Indentation Composite material Surface finish Nanoindentation Modulus Analytical Chemistry (journal) Elastic modulus Nanotechnology Optoelectronics Chemistry Metallurgy

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Topics

Metal and Thin Film Mechanics
Physical Sciences →  Engineering →  Mechanics of Materials
Diamond and Carbon-based Materials Research
Physical Sciences →  Materials Science →  Materials Chemistry
Silicon Carbide Semiconductor Technologies
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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