The performance tests of one type (named PDM-101) of silicon semiconductor dosimeter were carried out by using a 60Co point source (approximately 500 kBq). The dosimeter responds to dose equivalents on the order of 0.02 microSv although measured data show a large error for values < 0.08 microSv. The deviation of measured dose equivalents from calculated ones was < 10% in the region > or = 0.08 microSv. The deviation of measured dose equivalent rates from calculated ones was generally < 10%. The average value of measured dose equivalents for 31 directional exposures without underside exposure was 0.92 +/- 0.06 of the calculated value. The difference of measured data for the front and back exposure was < 10%. The background and noise level of the dosimeter was 0.092 +/- 0.005 microSv h-1. All measured data showed that dosimeter response for radiation was symmetric between the front (left) and the back (right) sides of the dosimeter within 10% tolerance.
Pedro García FernándezJ. María SalgueroJ. Manuel MartínezPedro PasiónAntonio Martínez‐SabaterRafael MachucaFrancisco Javier GravalosaPedro Martínez GarcíaMiguel A. Portillo
María Pilar Rivero GraciaManuel Martín-Bueno