Rydberg atom-based microwave electrometry and its applications

JOURNAL ARTICLE

Year: 2025 Journal: IET conference proceedings. Vol: 2025 (37)Pages: 92-96 Publisher: Institution of Engineering and Technology

DOI: 10.1049/icp.2025.4201

Keywords:

Microwave Rydberg formula Quality (philosophy) Mode (computer interface) Spectrum (functional analysis)

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