Electrochemical impedance spectroscopy (EIS) as a thin film characterization tool

Abstract

The induction of thin films on different surfaces has become a vital way of developing modern technology such as smart wearable instruments, screens, various electronic devices, optics, medical devices and corrosion protection. It is critical to investigate thin films’ physical, chemical and electrical properties to maximize their reliability and efficiency. Electrochemical impedance spectroscopy (EIS) is a significant non-destructive technique for examining the electrical and electrochemical characteristics of thin films and other modified electronic surfaces. Applications of EIS and its background theory will be discussed in detail within this book chapter, focusing on the role of EIS in developing thin films for various applications. Additionally, a survey of the benefits and drawbacks of EIS will be provided with examples.