JOURNAL ARTICLE

On the Reliability and Security of Ambient Backscatter Uplink NOMA Networks

Athanasios P. ChrysologouNestor D. ChatzidiamantisAlexandros-Apostolos A. BoulogeorgosZhiguo Ding

Year: 2025 Journal:   IEEE Transactions on Vehicular Technology Pages: 1-16   Publisher: Institute of Electrical and Electronics Engineers
Keywords:
Reliability (semiconductor) Telecommunications link Noma Backscatter (email) Signal-to-noise ratio (imaging) Cellular radio

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Geochemistry and Geologic Mapping
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Geological and Geophysical Studies
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Geological Modeling and Analysis
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