JOURNAL ARTICLE

Surface Charge Sensitivity of Silicon\nNanowires:  Size Dependence

Abstract

Silicon nanowires of different widths were fabricated in silicon on insulator (SOI) material using conventional process technology combined\nwith electron-beam lithography. The aim was to analyze the size dependence of the sensitivity of such nanowires for biomolecule detection\nand for other sensor applications. Results from electrical characterization of the nanowires show a threshold voltage increasing with decreasing\nwidth. When immersed in an acidic buffer solution, smaller nanowires exhibit large conductance changes while larger wires remain unaffected.\nThis behavior is also reflected in detected threshold shifts between buffer solutions of different pH, and we find that nanowires of width >150\nnm are virtually insensitive to the buffer pH. The increased sensitivity for smaller sizes is ascribed to the larger surface/volume ratio for\nsmaller wires exposing the channel to a more effective control by the local environment, similar to a surrounded gate transistor structure.\nComputer simulations confirm this behavior and show that sensing can be extended even down to the single charge level.

Keywords:
Nanowire Conductance Silicon Silicon on insulator Transistor Sensitivity (control systems) Buffer (optical fiber) Threshold voltage Surface charge

Metrics

0
Cited By
0.00
FWCI (Field Weighted Citation Impact)
0
Refs
0.49
Citation Normalized Percentile
Is in top 1%
Is in top 10%

Topics

Nanowire Synthesis and Applications
Physical Sciences →  Engineering →  Biomedical Engineering
Nanopore and Nanochannel Transport Studies
Physical Sciences →  Engineering →  Biomedical Engineering
Force Microscopy Techniques and Applications
Physical Sciences →  Physics and Astronomy →  Atomic and Molecular Physics, and Optics

Related Documents

JOURNAL ARTICLE

Erbium Surface-Enriched Silicon\nNanowires

Zhaoyu Wang (3059889)Jeffery L. Coffer (1524859)

Journal:   OPAL (Open@LaTrobe) (La Trobe University) Year: 2016
JOURNAL ARTICLE

Charge transfer from I2− (CO2)n cluster anion to silicon surface: cluster-size dependence

Hisato YasumatsuAkira TerasakiaTamotsu Kondow

Journal:   International Journal of Mass Spectrometry and Ion Processes Year: 1998 Vol: 174 (1-3)Pages: 297-303
JOURNAL ARTICLE

Size dependence of the surface charge density in EDL-MF

F.A. TourinhoAlex Fabiano Cortez CamposR. AquinoM.C.F.L. LaraJ. Depeyrot

Journal:   Journal of Magnetism and Magnetic Materials Year: 2002 Vol: 252 Pages: 29-31
JOURNAL ARTICLE

Crush zone size dependence on charge size

W.L. FourneyX. J. WangRichard D. Dick

Journal:   AIP conference proceedings Year: 1996 Vol: 370 Pages: 597-600
© 2026 ScienceGate Book Chapters — All rights reserved.