DefectSAM: Prototype Prompt Guided SAM for Few-Shot Defect Segmentation

Zhifei Wu; Shuying Zhao; Yunzhou Zhang; Yuxin Jin

doi:10.1109/tim.2025.3548183

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DefectSAM: Prototype Prompt Guided SAM for Few-Shot Defect Segmentation

Zhifei Wu Shuying Zhao Yunzhou Zhang Yuxin Jin

Year: 2025 Journal: IEEE Transactions on Instrumentation and Measurement Vol: 74 Pages: 1-13 Publisher: Institute of Electrical and Electronics Engineers

DOI: 10.1109/tim.2025.3548183

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Keywords:

Segmentation Image segmentation Pattern recognition (psychology) Scale-space segmentation Feature extraction Feature (linguistics)

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Mycorrhizal Fungi and Plant Interactions

Life Sciences → Agricultural and Biological Sciences → Plant Science

Genomics and Phylogenetic Studies

Life Sciences → Biochemistry, Genetics and Molecular Biology → Molecular Biology

Plant Pathogens and Fungal Diseases

Life Sciences → Biochemistry, Genetics and Molecular Biology → Cell Biology

DefectSAM: Prototype Prompt Guided SAM for Few-Shot Defect Segmentation

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