JOURNAL ARTICLE

Epitaxial\nZinc Stannate (Zn<sub>2</sub>SnO<sub>4</sub>) Thin Film for Solar\nCells

Abstract

Epitaxial Zn<sub>2</sub>SnO<sub>4</sub> thin films were fabricated\nusing rf magnetron sputtering and characterized via X-ray diffraction\n(XRD) to investigate its structural behaviors. XRD measurements indicate\nhigh-quality single crystal films of (400) orientation. The growth\nfollows cubic-to-cubic alignment with the epitaxial relationship of\nZn<sub>2</sub>SnO<sub>4</sub>[001]//MgO­[001] in the out-of-plane direction\nand Zn<sub>2</sub>SnO<sub>4</sub>[110]//MgO­[110] in the in-plane direction.\nThe Hall mobility of 88.5 ± 6.2 cm<sup>2</sup> V<sup>–1</sup> s<sup>–1</sup> was achieved. The Zn<sub>2</sub>SnO<sub>4</sub> films had average optical transmittance ≥90% and a band gap\nof 3.582 ± 0.082 eV. In the optical pump–THz probe spectroscopy\nresult, a relatively longer charge-carrier lifetime, <i>τ</i><sub>l</sub> = 2158.89 ps, was achieved.

Keywords:
Thin film Stannate Epitaxy Sputter deposition Transmittance Sputtering Single crystal

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Mycorrhizal Fungi and Plant Interactions
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