Nark-Eon Sung (1802212)Hee Jun Shin (4576195)Keun Hwa Chae (1788400)Sung Ok Won (2184693)Ik-Jae Lee (624611)
Epitaxial Zn<sub>2</sub>SnO<sub>4</sub> thin films were fabricated\nusing rf magnetron sputtering and characterized via X-ray diffraction\n(XRD) to investigate its structural behaviors. XRD measurements indicate\nhigh-quality single crystal films of (400) orientation. The growth\nfollows cubic-to-cubic alignment with the epitaxial relationship of\nZn<sub>2</sub>SnO<sub>4</sub>[001]//MgO[001] in the out-of-plane direction\nand Zn<sub>2</sub>SnO<sub>4</sub>[110]//MgO[110] in the in-plane direction.\nThe Hall mobility of 88.5 ± 6.2 cm<sup>2</sup> V<sup>–1</sup> s<sup>–1</sup> was achieved. The Zn<sub>2</sub>SnO<sub>4</sub> films had average optical transmittance ≥90% and a band gap\nof 3.582 ± 0.082 eV. In the optical pump–THz probe spectroscopy\nresult, a relatively longer charge-carrier lifetime, <i>τ</i><sub>l</sub> = 2158.89 ps, was achieved.
Bing Tan (2458099)Elizabeth Toman (2496838)Yanguang Li (438869)Yiying Wu (1285626)
Simone Anzellini (5397209)Daniel Diaz-Anichtchenko (13169675)Josu Sanchez-Martin (17778857)Robin Turnbull (2884334)Silvana Radescu (5216498)Andres Mujica (8189901)Alfonso Muñoz (1573987)Sergio Ferrari (47155)Laura Pampillo (17778860)Vitaliy Bilovol (17778863)Catalin Popescu (1717753)Daniel Errandonea (1574008)
Shigenori MatsushimaShinsuke KunitsuguKenkichiro KobayashiGenji Okada
Huatao Wu (4718124)Ming La (8050715)Lingwei Xue (2573857)Liwei Mi (1497985)Yongjun Han (4718121)Guoxue He (5877047)Changdong Chen (1726276)