L. J. Collins-McIntyreS. E. HarrisonP. SchönherrN.-J. SteinkeC. J. KinaneT. R. CharltonD. Alba-VeneroaA. PushpA. J. KellockS. S. P. ParkinJ. S. HarrisS. LangridgeG. van der LaanT. Hesjedal
\n\nWe report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. High-resolution XRD shows the exceptionally high crystalline quality of the doped films with no parasitic phases up to a Cr concentration of 12% (in % of the Bi sites occupied by substitutional Cr). The magnetic moment, measured by SQUID magnetometry, was found to be ${\\sim}2.1\\ \\mu_\\text{B}$ per Cr ion. The magnetic hysteresis curve shows an open loop with a coercive field of ${\\sim}10\\ \\text{mT}$ . The ferromagnetic transition temperature was determined to be $8.5\\ \\text{K}$ analyzing the magnetization-temperature gradient. PNR shows the film to be homogeneously ferromagnetic with no enhanced magnetism near the surface or interface.\n
S. J. StewartGerardo F. GoyaR. C. MercaderA.E. GoetaG. PunteF. Sapinya-Navarro
L. J. Collins‐McIntyreS. E. HarrisonPiet SchönherrNina‐Juliane SteinkeC. J. KinaneTimothy CharltonD. Alba-VeneroaAakash PushpA. J. KellockS. ParkinJ. S. HarrisS. LangridgeG. van der LaanT. Hesjedal
Thad WalkerAimin PangH. HopsterS. F. Alvarado
А. В. КривошееваВ. Л. ШапошниковJ.‐L. Lazzari
Martin PärnasteMoreno MarcelliniErik HolmströmNicolas BockJonas FranssonOlle ErikssonBjørgvin Hjörvarsson