Abstract

\n\nWe report the structural and magnetic study of Cr-doped Bi2Se3 thin films using x-ray diffraction (XRD), magnetometry and polarized neutron reflectometry (PNR). Epitaxial layers were grown on c-plane sapphire by molecular beam epitaxy in a two-step process. High-resolution XRD shows the exceptionally high crystalline quality of the doped films with no parasitic phases up to a Cr concentration of 12% (in % of the Bi sites occupied by substitutional Cr). The magnetic moment, measured by SQUID magnetometry, was found to be ${\\sim}2.1\\ \\mu_\\text{B}$ per Cr ion. The magnetic hysteresis curve shows an open loop with a coercive field of ${\\sim}10\\ \\text{mT}$ . The ferromagnetic transition temperature was determined to be $8.5\\ \\text{K}$ analyzing the magnetization-temperature gradient. PNR shows the film to be homogeneously ferromagnetic with no enhanced magnetism near the surface or interface.\n

Keywords:
Ferromagnetism Magnetometer Coercivity Squid Molecular beam epitaxy Neutron reflectometry Magnetic hysteresis Magnetism Neutron diffraction Hysteresis

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