Dr.Ramesh.B, H B Ananya, Kiran H C, Sinchana B S, Mahadesh L M
The increasing demand for effective technologies to identify and recognize criminal suspects has ledto significant advancements in face sketch recognition. This process typically involves forensic artistscreating sketches based on eyewitness descriptions, which are then matched against photographic databasesto identify potential suspects. However, the accuracy of these matches can be compromised by variousfactors, particularly occlusions in the sketches, such as masks or hats worn by suspects during crimes. Thisstudy proposes a novel approach that focuses on matching only pre selected facial regions that excludeocclusions in both sketches and corresponding mugshots
Trupti Bhase,Omkar Shinde, Pratik Pawar, Abhinay Karne, Divesh Baviskar
Dr.Ramesh.B, H B Ananya, Kiran H C, Sinchana B S, Mahadesh L M
Trupti Bhase,Omkar Shinde, Pratik Pawar, Abhinay Karne, Divesh Baviskar
Ashutosh PatilPranav TambeHrushikesh DinkarProf. Diksha Bhave