Fengshuo Zu (4590757)Patrick Amsalem (1796827)David A. Egger (1274031)Rongbin Wang (3073680)Christian M. Wolff (3938327)Honghua Fang (6265214)Maria Antonietta Loi (1299264)Dieter Neher (1269552)Leeor Kronik (1266069)Steffen Duhm (1291395)Norbert Koch (168547)
Photovoltaic\ncells based on halide perovskites, possessing remarkably\nhigh power conversion efficiencies have been reported. To push the\ndevelopment of such devices further, a comprehensive and reliable\nunderstanding of their electronic properties is essential but presently\nnot available. To provide a solid foundation for understanding the\nelectronic properties of polycrystalline thin films, we employ single-crystal\nband structure data from angle-resolved photoemission measurements.\nFor two prototypical perovskites (CH<sub>3</sub>NH<sub>3</sub>PbBr<sub>3</sub> and CH<sub>3</sub>NH<sub>3</sub>PbI<sub>3</sub>), we reveal\nthe band dispersion in two high-symmetry directions and identify the\nglobal valence band maxima. With these benchmark data, we construct\n“standard” photoemission spectra from polycrystalline\nthin film samples and resolve challenges discussed in the literature\nfor determining the valence band onset with high reliability. Within\nthe framework laid out here, the consistency of relating the energy\nlevel alignment in perovskite-based photovoltaic and optoelectronic\ndevices with their functional parameters is substantially enhanced.
Kenji KimuraToshio MatsushitaToshihiro Kondo
H.A.T.V. NanayakkaraGalhenage A. SewvandiQi Feng
Zihao LiuTomonori MatsushitaTakashi Kondo
Ziyu Wang (451367)Qingdong Ou (1731901)Yupeng Zhang (632467)Qianhui Zhang (2091760)Hui Ying Hoh (1651090)Qiaoliang Bao (1423375)
Zhen Fan (59888)Juanxiu Xiao (1355700)Kuan Sun (1355688)Lei Chen (54296)Yating Hu (1355685)Jianyong Ouyang (1355691)KhuongP. Ong (1355694)Kaiyang Zeng (1355697)John Wang (271394)