JOURNAL ARTICLE

Modelling bivariate failure time data via bivariate extended Chen distribution

Abstract

Abstract Fatal Shock, competing risks and stress models are utilized in reliability and survival analysis to characterize various application types. In this context, this paper aimed to introduce a new class of bivariate distribution based on the Marshall–Olkin type. The proposed distribution termed as the Bivariate Extended Chen (BEC) distribution so that the marginals have Extended Chen distribution. Some properties of this distribution are derived and explained. The BEC distribution parameters are estimated using the maximum likelihood method. Finally, two applications to real life applications highlight the significance and adaptability of the Bivariate Extended Chen (BEC) distribution. The BEC distribution offers a superior fit than different competing bivariate distributions, illustrating its flexibility and applicability in modelling.

Keywords:
Bivariate analysis Chen Reliability (semiconductor) Distribution (mathematics) Bivariate data Joint probability distribution Class (philosophy)

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Topics

Statistical Distribution Estimation and Applications
Physical Sciences →  Mathematics →  Statistics and Probability
Reliability and Maintenance Optimization
Physical Sciences →  Engineering →  Safety, Risk, Reliability and Quality
Statistical Methods and Bayesian Inference
Physical Sciences →  Mathematics →  Statistics and Probability

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