TESTING ANALOG-TO-DIGITAL CONVERTERS

MARK BAKER

doi:10.1016/b978-075067616-8/50008-x

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TESTING ANALOG-TO-DIGITAL CONVERTERS

MARK BAKER

Year: 2003 Elsevier eBooks Pages: 207-237 Publisher: Elsevier BV

DOI: 10.1016/b978-075067616-8/50008-x

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Keywords:

Differential nonlinearity Linearity Integral nonlinearity Histogram Converters Analog-to-digital converter Electronic engineering Computer science Successive approximation ADC Offset (computer science) Effective number of bits Mathematics Engineering Artificial intelligence Voltage Electrical engineering CMOS Comparator

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Advanced Electrical Measurement Techniques

Physical Sciences → Engineering → Electrical and Electronic Engineering

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture

TESTING ANALOG-TO-DIGITAL CONVERTERS

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