JOURNAL ARTICLE
Applications of x-ray interferometry in metrology
Year: 1975 Journal: Measurement Techniques Vol: 18 (7)Pages: 1020-1022 Publisher: Springer Science+Business Media
Keywords:
Metrology Interferometry Optics Materials science Physics
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Topics
Advanced X-ray and CT Imaging
Physical Sciences → Engineering → Biomedical Engineering
X-ray Spectroscopy and Fluorescence Analysis
Physical Sciences → Physics and Astronomy → Radiation
Nuclear Physics and Applications
Physical Sciences → Physics and Astronomy → Radiation
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