JOURNAL ARTICLE
YOLO-APGC: A lightweight method for BGA surface defect detection based on cross-scale feature fusion
Liwei FanYijia WangYongbing ZhouJian ZhangHaojie Chen
Year: 2025 Journal: Microelectronics Reliability Vol: 175 Pages: 115906-115906 Publisher: Elsevier BV
Keywords:
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FWCI (Field Weighted Citation Impact)
34
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0.45
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Topics
Industrial Vision Systems and Defect Detection
Physical Sciences → Engineering → Industrial and Manufacturing Engineering
Surface Roughness and Optical Measurements
Physical Sciences → Engineering → Computational Mechanics
Advanced Surface Polishing Techniques
Physical Sciences → Engineering → Biomedical Engineering
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