Robust Multilabel Feature Selection With Label Enhancement for Fault Diagnosis

Qingqi Han; Wei Zhang; Chi Ma; Jialong He; Wanfu Gao

doi:10.1109/tsmc.2025.3598796

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Robust Multilabel Feature Selection With Label Enhancement for Fault Diagnosis

Qingqi Han Wei Zhang Chi Ma Jialong He Wanfu Gao

Year: 2025 Journal: IEEE Transactions on Systems Man and Cybernetics Systems Vol: 55 (11)Pages: 7841-7850 Publisher: Institute of Electrical and Electronics Engineers

DOI: 10.1109/tsmc.2025.3598796

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Keywords:

Feature selection Selection (genetic algorithm) Artificial intelligence Computer science Feature (linguistics) Pattern recognition (psychology) Machine learning Fault (geology) Multi-label classification Data mining Biology

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Fault Detection and Control Systems

Physical Sciences → Engineering → Control and Systems Engineering

Advanced Computational Techniques and Applications

Physical Sciences → Computer Science → Artificial Intelligence

Rough Sets and Fuzzy Logic

Physical Sciences → Computer Science → Computational Theory and Mathematics

Robust Multilabel Feature Selection With Label Enhancement for Fault Diagnosis

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