BOOK-CHAPTER

Improved Metal Surface Defect Detection Model of YOLOv5 Combining CBAM and BiFPN

Yifan ZhangYao‐Wen ChangHuijie YuYifang WangKun BaiYunli YangHe LiWei XiaoChengxu Wu

Year: 2025 Communications in computer and information science Pages: 412-422   Publisher: Springer Science+Business Media
Keywords:
Surface (topology) Materials science Computer science Mathematics

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Topics

Industrial Vision Systems and Defect Detection
Physical Sciences →  Engineering →  Industrial and Manufacturing Engineering
Advanced Neural Network Applications
Physical Sciences →  Computer Science →  Computer Vision and Pattern Recognition
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences →  Engineering →  Electrical and Electronic Engineering

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