BOOK-CHAPTER
Improved Metal Surface Defect Detection Model of YOLOv5 Combining CBAM and BiFPN
Yifan ZhangYao‐Wen ChangHuijie YuYifang WangKun BaiYunli YangHe LiWei XiaoChengxu Wu
Year: 2025 Communications in computer and information science Pages: 412-422 Publisher: Springer Science+Business Media
Keywords:
Surface (topology) Materials science Computer science Mathematics
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Topics
Industrial Vision Systems and Defect Detection
Physical Sciences → Engineering → Industrial and Manufacturing Engineering
Advanced Neural Network Applications
Physical Sciences → Computer Science → Computer Vision and Pattern Recognition
Integrated Circuits and Semiconductor Failure Analysis
Physical Sciences → Engineering → Electrical and Electronic Engineering
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