Toward Efficient Device Identification in Massive Random Access: A Multi-Stage Approach

JOURNAL ARTICLE

Year: 2025 Journal: IEEE Transactions on Communications Vol: 73 (12)Pages: 13226-13238 Publisher: IEEE Communications Society

DOI: 10.1109/tcomm.2025.3593618

Keywords:

Identification (biology) Computer science Stage (stratigraphy) Electronic engineering Engineering

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.25

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

VLSI and Analog Circuit Testing

Physical Sciences → Computer Science → Hardware and Architecture