Improved YOLOv8 for lightweight insulator defect detection method

JOURNAL ARTICLE

Year: 2025 Pages: 194-194

DOI: 10.1117/12.3070856

Keywords:

Computer science Materials science

Metrics

Cited By

0.00

FWCI (Field Weighted Citation Impact)

Refs

0.32

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

High voltage insulation and dielectric phenomena

Physical Sciences → Materials Science → Materials Chemistry

Optical Systems and Laser Technology

Physical Sciences → Engineering → Electrical and Electronic Engineering