Semi-supervised few-shot learning using Critical-Descriptor Prototypes

Yukun Liu; Hualin Wan; Daming Shi

doi:10.1016/j.neucom.2025.130769

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Semi-supervised few-shot learning using Critical-Descriptor Prototypes

Yukun Liu Hualin Wan Daming Shi

Year: 2025 Journal: Neurocomputing Vol: 652 Pages: 130769-130769 Publisher: Elsevier BV

DOI: 10.1016/j.neucom.2025.130769

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Keywords:

Shot (pellet) Computer science Artificial intelligence Machine learning Supervised learning Pattern recognition (psychology) Artificial neural network Materials science

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Domain Adaptation and Few-Shot Learning

Physical Sciences → Computer Science → Artificial Intelligence

Machine Learning and ELM

Physical Sciences → Computer Science → Artificial Intelligence

Sparse and Compressive Sensing Techniques

Physical Sciences → Engineering → Computational Mechanics

Semi-supervised few-shot learning using Critical-Descriptor Prototypes

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