IIIM-SAM: Zero-Shot Texture Anomaly Detection Without External Prompts

Zhe Zhang; Yuhang Zhou; Jiahe Yue; Runchu Zhang; Jie Ma

doi:10.1109/tase.2025.3561776

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JOURNAL ARTICLE

IIIM-SAM: Zero-Shot Texture Anomaly Detection Without External Prompts

Zhe Zhang Yuhang Zhou Jiahe Yue Runchu Zhang Jie Ma

Year: 2025 Journal: IEEE Transactions on Automation Science and Engineering Vol: 22 Pages: 14610-14622 Publisher: Institute of Electrical and Electronics Engineers

DOI: 10.1109/tase.2025.3561776

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Keywords:

Shot (pellet) Anomaly detection Texture (cosmology) Zero (linguistics) Computer vision Artificial intelligence Computer science Materials science Image (mathematics)

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Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

IIIM-SAM: Zero-Shot Texture Anomaly Detection Without External Prompts

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