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JOURNAL ARTICLE

Deep-learning-driven end-to-end metalens imaging

Joonhyuk Seo Jaegang Jo Joohoon Kim J.S. Kang Chanik Kang Seong‐Won Moon Eunji Lee Jehyeong Hong Junsuk Rho Hsiao L. Chung

Year: 2024 Journal: Advanced Photonics Vol: 6 (06)

DOI: 10.1117/1.ap.6.6.066002

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Keywords:

End-to-end principle Computer science Artificial intelligence

Metrics

62

Cited By

18.60

FWCI (Field Weighted Citation Impact)

81

Refs

0.99

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Citation History

Topics

Electron and X-Ray Spectroscopy Techniques

Physical Sciences → Materials Science → Surfaces, Coatings and Films

Non-Destructive Testing Techniques

Physical Sciences → Engineering → Mechanical Engineering

Integrated Circuits and Semiconductor Failure Analysis

Physical Sciences → Engineering → Electrical and Electronic Engineering

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