Semi-supervised Lightweight Fabric Defect Detection

BOOK-CHAPTER

Year: 2024 Lecture notes in computer science Pages: 106-120 Publisher: Springer Science+Business Media

DOI: 10.1007/978-981-97-8505-6_8

Keywords:

Computer science Artificial intelligence Computer vision Pattern recognition (psychology) Engineering drawing Engineering

Metrics

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FWCI (Field Weighted Citation Impact)

Refs

0.53

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Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Image Processing Techniques and Applications

Physical Sciences → Engineering → Media Technology

Image and Object Detection Techniques

Physical Sciences → Computer Science → Computer Vision and Pattern Recognition