JOURNAL ARTICLE

A 578-TOPS/W RRAM-Based Binary Convolutional Neural Network Macro for Tiny AI Edge Devices

Lixun WangYuejun ZhangPengjun WangJianguo YangHuihong ZhangGang LiQikang Li

Year: 2024 Journal:   IEEE Transactions on Very Large Scale Integration (VLSI) Systems Vol: 33 (2)Pages: 371-383   Publisher: Institute of Electrical and Electronics Engineers
Keywords:
TOPS Convolutional neural network Enhanced Data Rates for GSM Evolution Macro Resistive random-access memory Computer science Binary number Artificial intelligence Arithmetic Engineering Mathematics Physics Electrical engineering Optics Programming language

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4
Cited By
2.56
FWCI (Field Weighted Citation Impact)
38
Refs
0.87
Citation Normalized Percentile
Is in top 1%
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Citation History

Topics

Machine Learning and ELM
Physical Sciences →  Computer Science →  Artificial Intelligence
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