Industrial Surface Defect Detection via Multi-scale Mask Cross-layer Fusion Network

JOURNAL ARTICLE

Year: 2024 Pages: 1-8

DOI: 10.1109/ijcnn60899.2024.10651547

Keywords:

Layer (electronics) Fusion Scale (ratio) Computer science Surface (topology) Materials science Nanotechnology Physics

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0.68

FWCI (Field Weighted Citation Impact)

Refs

0.66

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Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Advanced X-ray and CT Imaging

Physical Sciences → Engineering → Biomedical Engineering

Welding Techniques and Residual Stresses

Physical Sciences → Engineering → Mechanical Engineering