Energy-Optimised Design for Secure-Reliability within Finite Blocklength Regime

Chenhao Shi; Yao Zhu; Xinmin Li; Anke Schmeink

doi:10.1109/iswcs61526.2024.10639162

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JOURNAL ARTICLE

Energy-Optimised Design for Secure-Reliability within Finite Blocklength Regime

Chenhao Shi Yao Zhu Xinmin Li Anke Schmeink

Year: 2024 Pages: 1-6

DOI: 10.1109/iswcs61526.2024.10639162

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Keywords:

Reliability (semiconductor) Computer science Reliability engineering Energy (signal processing) Physics Engineering Mathematics Statistics Power (physics) Thermodynamics

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Semiconductor materials and devices

Physical Sciences → Engineering → Electrical and Electronic Engineering

Graphite, nuclear technology, radiation studies

Physical Sciences → Materials Science → Materials Chemistry

Radiation Effects in Electronics

Physical Sciences → Engineering → Electrical and Electronic Engineering

Energy-Optimised Design for Secure-Reliability within Finite Blocklength Regime

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