Self-supervised Learning for Robust Surface Defect Detection

BOOK-CHAPTER

Year: 2024 Communications in computer and information science Pages: 164-177 Publisher: Springer Science+Business Media

DOI: 10.1007/978-3-031-66705-3_11

Keywords:

Computer science Surface (topology) Artificial intelligence Pattern recognition (psychology) Mathematics

Metrics

Cited By

7.60

FWCI (Field Weighted Citation Impact)

Refs

0.96

Citation Normalized Percentile

Is in top 1%

Is in top 10%

Industrial Vision Systems and Defect Detection

Physical Sciences → Engineering → Industrial and Manufacturing Engineering

Machine Learning and Data Classification

Physical Sciences → Computer Science → Artificial Intelligence

Infrastructure Maintenance and Monitoring

Physical Sciences → Engineering → Civil and Structural Engineering